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High and Low Temperature Impact Test Chamber
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High and Low Temperature Impact Test Chamber

High and Low Temperature Impact Test Chamber

The High and low temperature impact test chamber simulates product tolerance under extreme and sudden temperature changes by rapidly switching between high- and low-temperature environments. It is widely used to evaluate the reliability and failure mechanisms of electronics, materials, and components under thermal stress.
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Product Introduction

Application Industries
 
 

Power Electronics

Tests the contact stability and insulation performance of relays and circuit breakers under frequent thermal shock.

 
 
 

Medical Devices

Evaluates the material compatibility and functional retention of high-value consumables and interventional devices under sudden temperature changes.

 
 
 

Consumer Electronics

Validates the structural strength and battery safety of wearable devices such as smartwatches and earbuds under extreme temperature differentials.

 

28-33

product-1-1

 

Product Features

 

Dual-System Independent Operation

High- and low-temperature systems are completely isolated, using independent refrigeration/heating units to prevent mutual interference during temperature switching.

Rapid Temperature Change Capability

Utilizes efficient heat exchange and forced convection design, achieving rapid temperature changes ≥10°C/min within the range of -65°C to +150°C.

Intelligent Safety Protection

Features multiple safeguards, including door-open protection, system overload alarms, and emergency cooling, ensuring safe and reliable testing.

 

1-201025135Z9119
1-201025135ZR56
1-201025135ZRb
1-201025135ZW95
1-201025135ZY57
 

 

product-1500-1200

 

Sales Q&A

 

 

Q: What is the maximum temperature change rate the equipment supports?

A: Under no-load conditions, the standard model can achieve a maximum temperature change rate of 15°C/min, with the actual rate varying depending on the sample's thermal capacity.

Q: Does it support continuous testing of multiple sample batches?

A: Yes, it supports programmable multi-task queuing, allowing preset test conditions to be executed sequentially without manual sample changes.

Q: How is sample safety ensured in case of equipment failure?

A: The device includes power-off memory and automatic protection functions, saving the current state and activating a safety mode during failures to prevent sample damage.

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